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Effect of gas pressure on permanent dark image sticking on a bright screen in AC plasma‐display panels
Author(s) -
Park ChoonSang,
Jang SooKwan,
Tae HeungSik,
Jung EunYoung,
Ahn JeongChull
Publication year - 2009
Publication title -
journal of the society for information display
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.578
H-Index - 52
eISSN - 1938-3657
pISSN - 1071-0922
DOI - 10.1889/jsid17.11.977
Subject(s) - phosphor , materials science , plasma display , luminance , analytical chemistry (journal) , layer (electronics) , plasma , photoluminescence , sputtering , optics , optoelectronics , thin film , chemistry , electrode , physics , composite material , nanotechnology , chromatography , quantum mechanics
— The permanent dark‐image‐sticking phenomenon on a bright screen was examined under various gas pressures in a 42‐in. ACPDP with an He(35%)‐Xe(11%)‐Ne gas composition. Infrared‐emission observations reveal that the discharge characteristics related to the MgO surface are almost the same in both the discharge and non‐discharge cells, whereas luminance observations show a deterioration in the visible‐conversion characteristics related to the phosphor layer in both the discharge and non‐discharge cells. Consequently, the permanent dark‐image‐sticking phenomenon on a bright screen is found to be strongly related to the deposition on the phosphor layer to the Mg species sputtered from the MgO surface due to a repetitive strong sustain discharge. For a decrease in gas pressure, the permanent dark image sticking on a bright screen became worse due to a severe degradation of the visible‐conversion characteristics of the phosphor layer caused by the deposition of higher amounts of sputtered Mg species on the phosphor layer, as confirmed by various measurements, such as V t closed curves, time‐of‐flight secondary‐ion mass spectrometry, photoluminescence, and atomic‐force‐microscope analyses.