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Aging of ZnS:Mn ALE ac thin‐film electroluminescent devices
Author(s) -
Soenen B.,
Neyts K.,
Bossche J.,
Visschere P.
Publication year - 1996
Publication title -
journal of the society for information display
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.578
H-Index - 52
eISSN - 1938-3657
pISSN - 1071-0922
DOI - 10.1889/1.4731185
Subject(s) - polarity (international relations) , waveform , materials science , electroluminescence , phosphor , voltage , optoelectronics , electric field , layer (electronics) , polarity symbols , field (mathematics) , condensed matter physics , electrical engineering , physics , chemistry , nanotechnology , breakdown voltage , mathematics , biochemistry , quantum mechanics , pure mathematics , cell , engineering
— The aging behavior of ZnS:Mn ACTFEL devices, driven with asymmetrical voltage waveforms, was analyzed. Samples were aged with asymmetrical waveforms, so a time‐averaged electric field exists in the phosphor layer during operation. Transient measurements were used to determine the voltage polarity dependence of the aging process. While with symmetrical aging and waveforms which cause a positive time‐averaged field the positive polarity is mainly affected, a negative time‐averaged field affects both polarities. A simple model to explain these measurements is proposed.