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Electro‐optic excitation/de‐excitation effects in SrS:Ce ACTFEL devices from 15 to 300K
Author(s) -
Plant T. K.,
Troppenz U.,
Hüttl B.,
Velthaus K. O.,
Mauch R. H.
Publication year - 1996
Publication title -
journal of the society for information display
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.578
H-Index - 52
eISSN - 1938-3657
pISSN - 1071-0922
DOI - 10.1889/1.4731179
Subject(s) - electroluminescence , excitation , luminescence , materials science , excited state , optoelectronics , photoluminescence , electric field , range (aeronautics) , delocalized electron , atomic physics , chemistry , nanotechnology , physics , organic chemistry , composite material , layer (electronics) , quantum mechanics
— The time‐resolved electroluminescence, EL spectrum, UV‐ and blue‐excited photoluminescence, and transferred charge of high‐efficiency blue SrS:Ce ac‐driven thin‐film electroluminescent (ACTFEL) devices were measured over the temperature range of 15–300K. The purpose of this work was to determine the mechanisms of both optical and electrical excitation/de‐excitation in these structures. We found that two thermally activated processes, a strong one around 100K and a weaker one around 200K, drastically reduce the Ce 3+ luminescent efficiency and limit the overall EL performance. Even though the total transferred charge increases with temperature, these two thermal de‐activation processes wipe out any luminescent gains due to increased transferred charge. The fact that a large trailing‐edge emission still exists at 15K indicates that space charge in the form of ionized Ce 3+ atoms caused by field‐induced delocalization is still present.