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56.3: Study of Space Charges in Hole Transfer Layer of OLED Devices using Impedance Spectroscopy and Transient Electroluminescence
Author(s) -
Choung Jiyoung,
Lee Joon G.,
Choi Jin B.,
Oh Il S.,
Cho Se J.,
Yoon Jin Y.,
Song Hyung J.,
Lee Yeon H.,
Lee Chang H.,
Kim Won J.,
Song Young W.,
Lee Jong H.,
Kim Sung C.
Publication year - 2011
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1889/1.3621458
Subject(s) - capacitance , electroluminescence , dielectric spectroscopy , materials science , space charge , transient (computer programming) , oled , optoelectronics , electrical impedance , voltage , analytical chemistry (journal) , layer (electronics) , chemistry , electrical engineering , physics , electrode , composite material , electrochemistry , quantum mechanics , chromatography , computer science , operating system , engineering , electron
The charge generation and transportation phenomena of OLED devices based on the different hole‐transfer materials, HTL1 and HTL2, have been investigated employing Impedance Spectroscopy (IS) and Transient Electroluminescence (TEL). The capacitance resulted from the quantity of space charges in HTL1 and HTL2 have been observed to be distinguishable by means of both the Capacitance‐Voltage and Frequency‐dependent Capacitance measurements. The capacitance increment by the space charges is also seen in the extracted RC components of the equivalent circuit, which is determined from the comparison between the quantitatively calculated and the experimentally observed data in Cole‐Cole plot. The increased space charges of HTL2 are found to enhance the hole mobility across hole transfer layer which was derived from the delayed response time of Transient EL.