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50.2: High Reliable In‐Ga‐Zn‐Oxide FET Based Electronic Global Shutter Sensors for In‐Cell Optical Touch Screens and Image Sensors
Author(s) -
Tamura Hikaru,
Hamada Toshiki,
Nakagawa Takashi,
Aoki Takeshi,
Ikeda Masataka,
Kozuma Munehiro,
Kurokawa Yoshiyuki,
Ikeda Takayuki,
Moriya Koji,
Hirakata Yoshiharu,
Kamata Nozomi,
Murakawa Tsutomu,
Koyama Jun,
Yamazaki Shunpei,
Tochibayashi Katsuaki,
Okazaki Kenichi,
Sakakura Masayuki
Publication year - 2011
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1889/1.3621430
Subject(s) - shutter , image sensor , pixel , liquid crystal display , rolling shutter , optoelectronics , materials science , computer science , semiconductor , electrical engineering , computer vision , optics , engineering , physics
Abstract A 6 inch XGA LCD touch screen with optical sensors in its pixels, using oxide semiconductor (OS) FETs has been developed. The extremely low off‐state current of the OS FET facilitates the use of a global shutter and leads to an improved accuracy of touch detection. The possibility of a novel application of a touch screen and an image sensor that is an application of the combination of OS FETs and global shutter is proposed.