49.3: Oxide TFT Scan Driver with Dynamic Threshold Voltage Control | Zendy

Park YongSung | Zendy; Chung BoYong | Zendy; Kang ChulKyu | Zendy; Park SeoungIl | Zendy; Im KiJu | Zendy; Jeong Jong Han | Zendy; Kim ByungHee | Zendy; Kim Sang Soo | Zendy

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49.3: Oxide TFT Scan Driver with Dynamic Threshold Voltage Control

Author(s) -

Park YongSung,

Chung BoYong,

Kang ChulKyu,

Park SeoungIl,

Im KiJu,

Jeong Jong Han,

Kim ByungHee,

Kim Sang Soo

Publication year - 2011

Publication title -

sid symposium digest of technical papers

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.351

H-Index - 44

eISSN - 2168-0159

pISSN - 0097-966X

DOI - 10.1889/1.3621426

Subject(s) - threshold voltage , amoled , thin film transistor , voltage , materials science , leakage (economics) , electrical engineering , computer science , optoelectronics , electronic engineering , transistor , engineering , nanotechnology , active matrix , layer (electronics) , economics , macroeconomics

Oxide TFTs have a negative threshold voltage (V th ), which can become even more negative in response to DC or AC stress. Therefore, these voltage stresses can cause severe leakage current in a scan driver. In this paper, a scan driver with dynamic threshold voltage control (DTVC) is proposed to minimize the leakage current and enlarge operating margin. Effectiveness of DTVC was verified with a 14‐inch AMOLED.

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