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44‐2: Characteristics of (Mg, Ca)O Thin Film Layer Sealed under Nitrogen Atmosphere
Author(s) -
Choi HakNyun,
Kim SangYoung,
Kim YouHan,
Jeong Seok,
Kim YongSeog
Publication year - 2011
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1889/1.3621402
Subject(s) - atmosphere (unit) , nitrogen , layer (electronics) , materials science , nitrogen gas , controlled atmosphere , analytical chemistry (journal) , voltage , composite material , chemistry , electrical engineering , environmental chemistry , meteorology , physics , organic chemistry , engineering
In this study, firing voltages of (Mg, Ca)O film in AC PDP test panels sealed under nitrogen atmosphere were measured. CaO content in the film was changed from 5 to 20% and its effect on firing voltage was evaluated. In addition, the effect of nitrogen atmosphere sealing on the film was examined by measuring exo‐electron emission from the film.