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37.3: Wall Voltage Loss by Exoemission
Author(s) -
Awaji Noriyuki,
Tolner Harm,
Miyamoto Shintaro,
Kajiyama Hiroshi
Publication year - 2011
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1889/1.3621369
Subject(s) - materials science , voltage , physics , quantum mechanics
The loss of wall voltage during the addressing waiting time t w has been investigated, and is found to correspond to an effective exoemission current that is inversely related to the time, i.e. Iexo ∼ 1/t w . This relation is approximately valid over 3 decades from 20 usec to 16.7 msec. The wall voltage loss for Sc 3+ doped MgO is about three times larger than that of non‐doped MgO.