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P‐177: Extraction of Printed OLED Internal Emission Characteristics
Author(s) -
Hildner Mark L.,
Ziebarth Jonathan M.
Publication year - 2011
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1889/1.3621234
Subject(s) - oled , spectral line , emission spectrum , materials science , optoelectronics , layer (electronics) , extraction (chemistry) , viewing angle , optics , physics , chemistry , nanotechnology , chromatography , astronomy , liquid crystal display
OLED internal emission spectra are obtained from EL spectra and optical modeling by two methods. Method 1 uses normal viewing angle spectra from devices of varying emissive layer thickness. Method 2 uses spectra at multiple angles from one device. Internal quantum efficiency and emission zone information are also obtained.