Premium
P‐170: Influence of HFE Solvent Processing on OLED Lifetime
Author(s) -
Zakhidov Alex A.,
Lüssem Björn,
Leo Karl,
DeFranco John
Publication year - 2011
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1889/1.3621226
Subject(s) - oled , photolithography , brightness , materials science , luminescence , optoelectronics , solvent , organic solvent , lithography , analytical chemistry (journal) , nanotechnology , chemistry , chemical engineering , optics , organic chemistry , physics , engineering , layer (electronics)
Abstract The structurization of organic thin film devices is a challenge, since they are usually incompatible with standard lithography processes. Here, we report on the influence of a fluorinated solvent on the performance and lifetime of small molecule organic light emitting diodes (OLEDs). An initial test right after processing shows only a marginal difference between treated devices and reference device. Luminescence decay curves to 90% brightness (LLT90) data confirm that no long‐term damage with respect to the reference sample occurs. LLT90 for treated sample approaches 100,000 hours, which makes this solvent acceptable for wet chemical processing such as photolithography.