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P‐96: Analysis of Address Discharge Delay Characteristics Using Transient Characteristics of IR Emission Intensity in Plasma Display Panel
Author(s) -
Park Hyung Dal,
Kim Jae Hyun,
Tae HeungSik,
Kim Deok Myeong,
Seo Jeong Hyun
Publication year - 2011
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1889/1.3621130
Subject(s) - transient (computer programming) , plasma display , reset (finance) , intensity (physics) , erasure , materials science , emission intensity , plasma , falling (accident) , electrode , mechanics , optoelectronics , physics , optics , computer science , luminescence , medicine , environmental health , quantum mechanics , financial economics , economics , programming language , operating system
This paper analyzes the address discharge delay characteristics based on the measurement of the transient IR emission intensity according to the wall charge state after the reset discharge. This measurement result shows that the maximal erasure of the wall charges accumulating on the scan and address electrodes during the negative ramp‐falling period induces the easy transition from the weak discharge to the strong discharge, thereby resulting in shortening the statistical delay time.