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P‐95: A Study of Jitter Characteristics Depending on Wall Charge Status on an Emissive Layer via IR Measurement
Author(s) -
Lee Sangjoon,
Eom Sangheum,
Kang Jungwon
Publication year - 2011
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1889/1.3621129
Subject(s) - jitter , materials science , polarity (international relations) , photometer , electrode , voltage , layer (electronics) , charge (physics) , optoelectronics , optics , analytical chemistry (journal) , chemistry , electrical engineering , physics , nanotechnology , biochemistry , chromatography , quantum mechanics , cell , engineering
We investigated the jitter characteristics depending on wall charge amount and polarity on different emissive layers, such as MgO and CEL MgO. IR emission from Xe discharge was measured with IR photometer and iCCD. The accumulation of negative wall charges on pulse‐applied electrode and negative applied voltage were important to decrease the operation voltage and time delay.