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P‐84: Mechanical Reliability of Digital Micro Shutter (DMS™) Displays
Author(s) -
Wu Joyce H.,
Steyn J. Lodewyk,
Brosnihan Timothy,
Fike Gene,
Fijol John,
Payne Richard,
Hagood Nesbitt
Publication year - 2011
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1889/1.3621114
Subject(s) - backplane , shutter , microelectromechanical systems , reliability (semiconductor) , drop (telecommunication) , failure mode and effects analysis , computer science , materials science , engineering , computer hardware , structural engineering , electrical engineering , mechanical engineering , optoelectronics , power (physics) , physics , quantum mechanics
The Pixtronix DMS display technology is based on MEMS shutters on an active TFT backplane. The mechanical reliability of MEMS shutters in displays has been tested in standard display tests and is presented for the first time. Prototype displays have passed drop, vibration, and press tests. Also, displays were tested to failure in drop tests to find the failure mode of the MEMS shutters.