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P‐78: Measurement Methods for Solution‐Coated AMOLED Display Uniformity
Author(s) -
Ziebarth Jonathan,
Andreatta Alejandro,
Chesterfield Reid,
Frischknecht Kyle,
Johnson Andrew,
Stainer Matthew
Publication year - 2011
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1889/1.3621104
Subject(s) - amoled , materials science , computer science , process engineering , range (aeronautics) , nanotechnology , engineering , composite material , thin film transistor , layer (electronics) , active matrix
DuPont Displays has developed a full set of high performance materials and solution processing technology to address the high cost of manufacturing AMOLEDs. Using a wide variety of custom modeling and analytical approaches we have developed short and long range film thickness control and uniformity which is commercially viable at large glass sizes. In this paper we describe some of the measurement methods we developed, and results measured.