Premium
70.4: Optical Characterization of Scattering Anti‐Glare Layers
Author(s) -
Becker Michael E.,
Neumeier Jürgen
Publication year - 2011
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1889/1.3620997
Subject(s) - glare , characterization (materials science) , optics , clarity , scattering , reduction (mathematics) , measure (data warehouse) , materials science , computer science , artificial intelligence , physics , mathematics , nanotechnology , chemistry , geometry , data mining , biochemistry , layer (electronics)
We present methods for evaluation of the visual sparkle of anti‐glare treated surfaces and compare the results to visual ratings of expert observers. In addition we measure and characterize the reduction of image clarity induced by the scattering of microstructured AG‐surfaces and the reduction of unwanted reflections achieved by the anti‐glare layers.