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47.1: Invited Paper : Highly Robust Flexible AMOLED Display on Plastic Substrate with New Structure
Author(s) -
Jin DongUn,
Kim TaeWoong,
Koo HyunWoo,
Stryakhilev Denis,
Kim HyungSik,
Seo SangJoon,
Kim MooJin,
Min HoonKee,
Chung HoKyoon,
Kim SangSoo
Publication year - 2010
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1889/1.3500565
Subject(s) - thin film transistor , bend radius , materials science , optoelectronics , bending , substrate (aquarium) , amorphous solid , transistor , leakage (economics) , backplane , radius , composite material , optics , electrical engineering , voltage , crystallography , computer science , engineering , oceanography , chemistry , computer security , physics , layer (electronics) , economics , macroeconomics , geology
A new flexible TFT backplane structure with improved mechanical reliability has been fabricated on a plastic substrate using amorphous indium‐gallium‐zinc‐oxide (a‐IGZO) thin film transistors. The panel withstood 10,000 bending cycles at a bending radius of 5 mm without any noticeable TFT degradation. After the bending test, change of V th , mobility, sub‐threshold slope, and gate leakage current were only −0.10V, −0.11cm 2 /V‐s, 0.01V/decade, and −1.03×10‐ −12 A, respectively. No line defects, dark spots, or bright spots appeared after 10K bending cycles at a bend radius of 10 mm.