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35.2: Invited Paper : A Consideration of Excitation and De‐excitation Process of MgO Protective Layer
Author(s) -
Kajiyama Hiroshi,
Awaji Noriyuki,
Suesada Kazuma,
Tolner Harm
Publication year - 2010
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1889/1.3500508
Subject(s) - excitation , luminescence , layer (electronics) , spectroscopy , atomic physics , materials science , cathode , electron , analytical chemistry (journal) , chemistry , optoelectronics , nanotechnology , physics , electrical engineering , engineering , chromatography , quantum mechanics
Dynamic response of MgO protective layer to VUV irradiation and discharge is investigated by using cathode luminescence (CL) spectroscopy, thermolimunescence (TL) spectroscopy and exo‐ electron analysis. The dynamics of excitation and de‐excitation processes of electron and hole traps are discussed.