35.1:  Invited Paper : Very Sensitive Measurement Method of Plasma‐Display Exoemission | Zendy

Weber Larry F. | Zendy; Yan Qun Frank | Zendy

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35.1: Invited Paper : Very Sensitive Measurement Method of Plasma‐Display Exoemission

Author(s) -

Weber Larry F.,

Yan Qun Frank

Publication year - 2010

Publication title -

sid symposium digest of technical papers

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.351

H-Index - 44

eISSN - 2168-0159

pISSN - 0097-966X

DOI - 10.1889/1.3500507

Subject(s) - waveform , amplifier , electrical impedance , capacitance , materials science , plasma , displacement current , electrical engineering , optoelectronics , output impedance , physics , acoustics , current (fluid) , voltage , engineering , electrode , cmos , quantum mechanics

The very low exoemission currents are easily measured using an ultra high impedance amplifier which detects the integrated exoemission charge collected by a capacitance. The large discharge and displacement currents initiated by the changing sustain waveform, which could overload and saturate the sensitive amplifier, are shorted by a very low impedance switch.

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