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P‐106: Real‐Time Inspection of a Moisture Barrier Film Buried by a Protective Layer for Flexible Displays
Author(s) -
Zhang Yadong,
Jen ShihHui,
Yang Ronggui,
George Steven M.,
Lee YungCheng
Publication year - 2010
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1889/1.3500195
Subject(s) - reliability (semiconductor) , moisture , materials science , layer (electronics) , cracking , composite material , degradation (telecommunications) , stress (linguistics) , computer science , telecommunications , power (physics) , linguistics , physics , philosophy , quantum mechanics
Stress‐induced cracks in moisture barriers may lead to device degradation in flexible displays. We developed an optical technique that can inspect the cracking of stressed barrier films buried by protective layers. This technique allows rapid and large‐area evaluation of mechanical reliability of moisture barriers and functional layers for flexible displays.