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P‐189L: Late‐News Poster : Solution‐processed Passivation Layer for a‐Si TFTs with High Reliability and Processability for LCD
Author(s) -
Sugitani Koichi,
Tanabe Akihiro,
Hanmura Masahiro,
Ohmori Hironori,
Katoh Takeyoshi,
Tada Mitsushi,
Suzuki Teruhiko
Publication year - 2010
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1889/1.3499987
Subject(s) - passivation , reliability (semiconductor) , liquid crystal display , layer (electronics) , materials science , optoelectronics , thin film transistor , amorphous solid , silicone , computer science , composite material , chemistry , power (physics) , crystallography , physics , quantum mechanics
We have developed a solution‐processed passivation layer for amorphous Silicone TFTs. The passivation layer has both high reliability and processability for LCD. It can contribute to the reduction of manufacturing cost and RC signal delay problem in a major trend toward larger size of LCD panel.