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P‐38: Unique Electrical Measurement Technology for Compensation, Inspection, and Process Diagnostics of AMOLED HDTV
Author(s) -
Alexander Stefan,
Chaji G. Reza,
Dionne J. Marcel,
Church Corbin,
Hamer John,
Nathan Arokia
Publication year - 2010
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1889/1.3499951
Subject(s) - amoled , backplane , compensation (psychology) , oled , thin film transistor , mura , process (computing) , high definition television , computer science , factory (object oriented programming) , materials science , electrical engineering , computer hardware , liquid crystal display , engineering , optoelectronics , telecommunications , active matrix , nanotechnology , psychology , layer (electronics) , psychoanalysis , operating system , programming language
A unique measurement and compensation technology for AMOLED high definition television is presented. The technique electrically measures every TFT and OLED in the backplane, useful for inspection and diagnostics in the factory, and subsequent compensation of mura, TFT‐ and OLED‐degradation.