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65.2: Distinguished Paper : World‐Largest (6.5”) Flexible Full Color Top Emission AMOLED Display on Plastic Film and Its Bending Properties
Author(s) -
Jin DongUn,
Lee JaeSup,
Kim TaeWoong,
An SungGuk,
Straykhilev Denis,
Pyo YoungShin,
Kim HyungSik,
Lee DongBum,
Mo YeonGon,
Kim HyeDong,
Chung HoKyoon
Publication year - 2009
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1889/1.3256964
Subject(s) - amoled , thin film transistor , materials science , bend radius , active matrix , flexible display , optoelectronics , backplane , radius of curvature , subthreshold slope , threshold voltage , oled , bending , transistor , composite material , curvature , electrical engineering , voltage , layer (electronics) , mean curvature flow , mean curvature , geometry , mathematics , engineering
The world largest flexible full color 6.5‐inch active matrix organic light emitting diode (AMOLED) display with top emission mode on plastic film is demonstrated. The active matrix backplanes were fabricated using metal oxide thin film transistors (TFTs). The n‐channel metal oxide TFTs on plastic film exhibited field‐effect mobility of 17.8 cm 2 /Vs, threshold voltage of 0.4 V, on/off ratio of 1.1× 108, and subthreshold slope of 0.34 V/dec. These TFT performance characteristics made it possible to integrate scan driver circuit, demux switching and compensation circuit on the panel. Bending tests were performed with TFT backplane samples to determine critical curvature radius to which the panel can be bent without TFT performance degradation. The results were compared with the calculations that took into account thicknesses and mechanical constants of flexible substrate and of thin‐film layers in AMOLED device.