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46.2: Invited Paper : Enhanced Long‐Term Stabilities in Fluorescent and Phosphorescent Organic Light Emitting Device
Author(s) -
Murata Hideyuki,
Matsushima Toshinori
Publication year - 2009
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1889/1.3256876
Subject(s) - phosphorescence , oled , fluorescence , materials science , fabrication , optoelectronics , degradation (telecommunications) , phosphorescent organic light emitting diode , nanotechnology , optics , computer science , telecommunications , layer (electronics) , physics , medicine , alternative medicine , pathology
In this paper, we have investigate that the degradation mechanism of OLEDs using Alq 3 and FIrpic as emitting materials. for the Alq 3 device, ultra‐thin layers of MoO 3 significantly enhance the device durability. The optimized MoO 3 thickness was 0.75 nm, realizing the lowest voltage and the longest lifetime. We found that the device stabilities strongly depend on the process pressure during the device fabrication. In both fluorescent and phosphorescent emitting materials, the devices fabricated under UHV conditions demonstrated excellent long‐term stabilities.