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24.2: Robustness of Display Reflectance Measurements: Comparison between BRDF and Hemispherical Diffuse Reflectance
Author(s) -
Kim Seungkwan,
Kelley Edward F.,
Penczek John
Publication year - 2009
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1889/1.3256777
Subject(s) - bidirectional reflectance distribution function , specular reflection , reflectivity , diffuse reflection , optics , materials science , physics
We measured in‐plane bidirectional‐reflectance‐distribution‐function (BRDF) profiles for specular, haze and Lambertian samples using a converging light beam and a photopic photodiode. The results were validated by comparing the hemispherical reflectance values calculated from BRDF data with direct measurements by the use of integrating spheres, whereby an agreement to within 2 % was achieved.

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