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P‐148: Temperature Dependence of Degradation in Organic Light‐Emitting Diodes
Author(s) -
Kondakova Marina E.,
Young Ralph H.,
Jarikov Viktor V.,
Giesen David J.
Publication year - 2009
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1889/1.3256650
Subject(s) - oled , dopant , luminance , materials science , degradation (telecommunications) , optoelectronics , capacitance , diode , fluorescence , doping , dopant activation , voltage , threshold voltage , scaling , electroluminescence , chemistry , optics , electrode , physics , electrical engineering , nanotechnology , layer (electronics) , engineering , quantum mechanics , transistor , geometry , mathematics
Prolonged operation of an OLED degrades the luminance and alters the voltage‐dependent capacitance. The loss of luminance in simple blue and green fluorescent OLEDs is linearly correlated with internal charge accumulation at the HTL|LEL interface. The shapes of the EL decay curve and the transition‐voltage‐rise curve are independent of temperature. Proper scaling of the time axis makes plots of EL or transition voltage vs. time at different temperatures to coincide. The resulting universal decay curves are not altered by the introduction of the fluorescent dopant, suggesting that the degradation processes are the same in the doped and undoped devices. Red fluorescent OLEDs of more complicated structure degrade in a dopant‐dependent manner.