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P‐70: Characterization of Liquid Crystal Material and Cell by means of Generalized Spectroscopic Ellipsometry
Author(s) -
Valyukh Sergiy,
Kozachenko Andriy,
Valyukh Iryna
Publication year - 2009
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1889/1.3256557
Subject(s) - ellipsometry , liquid crystal , characterization (materials science) , dielectric , materials science , anchoring , crystal (programming language) , layer (electronics) , optics , field (mathematics) , distribution (mathematics) , analytical chemistry (journal) , optoelectronics , thin film , chemistry , nanotechnology , physics , organic chemistry , mathematics , structural engineering , computer science , engineering , programming language , mathematical analysis , pure mathematics
Generalized spectroscopic ellipsometry is applied for precise measurements of the configuration and optical parameters of the liquid crystal (LC) layer with a twisted structure. The elastic and dielectric constants of the LC material, as well as anchoring energy, are determining from measuring director distribution under electrical field.