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P‐16: A Scan Driver Circuit Using Transparent Thin Film Transistors
Author(s) -
Hwang TongHun,
Hong Seokin,
Hong Wonkee,
Cui WenHai,
Yang IkSeok,
Kwon OhKyong,
Byun ChoonWon,
Park SangHee Ko,
Hwang ChiSun,
Cho Kyong Ik
Publication year - 2009
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1889/1.3256486
Subject(s) - thin film transistor , robustness (evolution) , transistor , electronic circuit , logic level , power consumption , swing , electrical engineering , voltage , materials science , computer science , electronic engineering , power (physics) , engineering , physics , mechanical engineering , biochemistry , chemistry , layer (electronics) , quantum mechanics , gene , composite material
Abstract In this paper, we proposed two types of integrated scan driver circuits using only n‐channel zinc‐oxide (ZnO) thin film transistors (TFTs). One is the scan driver circuit for low‐power consumption and the other scan driver is for robustness to threshold voltage and mobility variation. The proposed scan driver for low‐power consumption is embedding level shifter and its power consumption was 1.4 mW. The scan driver for robustness used positive feedback circuits as pull‐up devices. By simulation results, the proposed scan driver has robustness in the frequency, temperature, and process variation compared to conventional scan drivers. Also, two proposed scan drivers have advantages of full swing output range from V DD to V SS .