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4.2: International Metrology Standards for Reflective LCDs
Author(s) -
Laur Juergen
Publication year - 2008
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1889/1.3069628
Subject(s) - standardization , metrology , harmonization , international standardization , computer science , liquid crystal display , engineering drawing , systems engineering , engineering , optics , physics , acoustics , operating system
This paper summarizes the development of metrology for reflective LCDs from the late 1970s to our days, it introduces the two different approaches used in the LCD industry (directional and multi‐directional illumination) and explains the distinct differences in the results obtained with the two methods. The current status of the standardization of measuring methods for reflective LCDs by the WG2 of IEC TC110 is presented and an outlook is given of the work to be done before finalization of this standard, especially when the recently initiated horizontal harmonization activity of the IEC TC110 is supposed to be taken into account.