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P‐228: Degradation of White Light Emitting OLEDs
Author(s) -
Song JungBae,
Lee Sunghun,
Kim MuGyeom,
Kim SangYeol,
Son YoungMok,
Jeon Woo Sung,
Won Jeongyeon,
Song Inyong,
Han Hyouk Soo,
Kim Dai Kyu,
Chung JaeGwan,
Kang SungKee,
Tamura Shinichiro,
Kim JongMin,
Choi JunHo,
Ha JaeKook,
Lee SungSoo,
Chu ChangWoong
Publication year - 2008
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1889/1.3069610
Subject(s) - degradation (telecommunications) , oled , cathode , layer (electronics) , optoelectronics , materials science , interface (matter) , white light , chemistry , computer science , nanotechnology , composite material , telecommunications , capillary number , capillary action
We firstly report the degradation analysis of multilayer structured WOLED by using spectroscopic and microscopic analytical methods. Our analytical results demonstrated that the interface between cathode and electron‐transporting layer is responsible for the intrinsic long‐term degradation of WOLEDs.