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P‐258L: Late‐News Poster : Analysis of Internal Reflectance in AFFS Plus Technology
Author(s) -
Park Jun Baek,
Choi Suk,
Shin Young Joon,
Park Kwang Hyun,
Cho Yoon Sung
Publication year - 2008
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1889/1.3069568
Subject(s) - reflectivity , readability , materials science , optics , computer science , physics , programming language
In this paper, we have investigated about internal reflectance in AFFS plus. Internal reflectance is composed of metal and pixel reflectance. From the calculation, designed metal reflectance is almost same to measured reflectance. To improve pixel reflectance and outdoor readability, DBEF sheet and negative LC with high efficiency is adopted.