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15.3: Anti‐Electromigration of Lead‐Free Ag/Frit Modified Address Electrodes in PDPs
Author(s) -
Kim ChulHong,
Jeong HyunMi,
Heo EunGi,
Lee ByungHak,
Yu ByoungYoul,
Lee ByungChul,
Kim HyunDon,
Kweon TaeJong
Publication year - 2008
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1889/1.3069561
Subject(s) - frit , electrode , materials science , electromigration , lead (geology) , optoelectronics , composite material , process (computing) , computer science , chemistry , geomorphology , geology , operating system
We have studied on the usage reduction and anti‐migration properties of newly formulated lead‐Free (Bi‐based) Ag/Frit modified address electrode (hereinafter VE electrode) systems in PDPs (Plasma Display Panels). It is thought that their high performance such as anti‐migration and the cost‐competitiveness without any loss of performance in paste, process and luminous efficacy are originated from the optimum controlling of Ag/Frit weight ratio and low specific gravity by low Ag contents, respectively. Currently, lead‐free VE electrodes are being applied as main electrode materials of PDP panels fabricated by SDI photo‐imageable patterning process including ultra‐fine resolution models.