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P‐255L: Late‐News Poster : Precise Measurement of LC Material Parameters for Ultra‐High Resolution Full‐HD OCB‐Mode FSC‐LCD
Author(s) -
Kishimoto Tadashi,
Wako Kazuhiro,
Ishinabe Takahiro,
Miyashita Tetsuya,
Suzuki Yoshito,
Uchida Tatsuo
Publication year - 2008
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1889/1.3069545
Subject(s) - liquid crystal display , materials science , power consumption , brightness , compensation (psychology) , capacitance , mode (computer interface) , high resolution , anchoring , resolution (logic) , liquid crystal , power (physics) , optoelectronics , optics , computer science , physics , engineering , artificial intelligence , structural engineering , remote sensing , psychology , electrode , quantum mechanics , psychoanalysis , geology , operating system
A highly precise measurement method of LC material parameters was proposed by application of the new driving scheme of LC and the compensation for the capacitance of alignment layer and the anchoring strength of LC cell. This new measurement method results in the development of high‐speed 6.5inch Full‐HD OCB‐mode FSC‐LCD with an ultra‐high resolution, high brightness and low power consumption.