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P‐145: Influence of Crystal Structure of Doped MgO on Jitter Time in SM‐PDP
Author(s) -
Li Qing,
Tolner Harm,
Yang LanLan,
Tang Yongming,
Zheng Yaosheng,
Kuang Yawei,
Shi Yinxin,
Song Minggui,
Zhang Qi,
Lin Qingyuan,
Wang Baoping
Publication year - 2008
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1889/1.3069514
Subject(s) - jitter , materials science , beam (structure) , deposition (geology) , doping , crystal (programming language) , intensity (physics) , crystal structure , analytical chemistry (journal) , optics , optoelectronics , chemistry , electronic engineering , crystallography , physics , computer science , paleontology , chromatography , sediment , engineering , biology , programming language
The effect of the MgO crystal structure on the addressing discharge jitter in SMPDP is investigated. By varying the oxygen pressure during E‐beam deposition, different MgO crystal structure was made, as analyzed by XRD. The jitter time in a PDP panel was measured for isolated On‐pixels at low intensity levels. The conclusion is that the jitter time can be decreased by maximizing the relative (200)/(111) peak ratio, obtained by decreasing the O 2 addition during E‐Beam MgO deposition.