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P‐93: Characterizing Dielectric Tensors with Biaxial Ellipsometry
Author(s) -
Smith Paula K.,
McClain Stephen C.,
Chipman Russell A.
Publication year - 2008
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1889/1.3069450
Subject(s) - ellipsometry , polarimeter , materials science , dielectric , anisotropy , liquid crystal , mueller calculus , optics , polymer , birefringence , uniaxial crystal , tensor (intrinsic definition) , polarimetry , optoelectronics , composite material , thin film , optical axis , physics , mathematics , nanotechnology , geometry , scattering , lens (geology)
Dielectric tensors of anisotropic substrates and films can be determined by biaxial ellipsometry, an extension of conventional ellipsometry. This technique utilizes an angle‐of‐incidence Mueller matrix imaging polarimeter. An example of the determination of the dielectric tensor of liquid crystal polymer films for retarders is presented.