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New electrical test method for LCD cell‐manufacturing process
Author(s) -
Miyake Yasuhiro,
Chikamatsu Kiyoshi,
Mizoguchi Junichi
Publication year - 2008
Publication title -
journal of the society for information display
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.578
H-Index - 52
eISSN - 1938-3657
pISSN - 1071-0922
DOI - 10.1889/1.2835040
Subject(s) - computer science , process (computing) , test method , liquid crystal display , test (biology) , manufacturing process , scheme (mathematics) , computer hardware , automotive engineering , materials science , engineering , mathematics , paleontology , mathematical analysis , statistics , composite material , biology , operating system
— A new electrical test method resulting in repeatable and unambiguous test results, which solves the drawback of the current lighting test used for the LCD cell‐manufacturing process, is proposed. This paper shows the basic scheme and the wide test coverage of this test method to detect defects in the cell process and gives an example of the actual measurement result.