P‐93: Analysis of Optical Emission Spectra from AC‐PDPs for Various Xe Content | Zendy

Uchida Giichiro | Zendy; Kajiyama Hiroshi | Zendy; Shinoda Tsutae | Zendy

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P‐93: Analysis of Optical Emission Spectra from AC‐PDPs for Various Xe Content

Author(s) -

Uchida Giichiro,

Kajiyama Hiroshi,

Shinoda Tsutae

Publication year - 2007

Publication title -

sid symposium digest of technical papers

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.351

H-Index - 44

eISSN - 2168-0159

pISSN - 0097-966X

DOI - 10.1889/1.2785359

Subject(s) - xenon , atomic physics , spectral line , emission intensity , emission spectrum , intensity (physics) , analytical chemistry (journal) , atom (system on chip) , chemistry , physics , ion , optics , organic chemistry , chromatography , astronomy , computer science , embedded system

Here is presented the time‐resolved measurements on optical emission spectra from AC‐PDP with various Xe contents. Experiments show that the relative emission intensity (n Xe /n Ne) I Ne(585nm) /I Xe(823nm) , which is induced from Ne and Xe atom, drastically decreases with discharge time, where the relative emission intensity is normalized by neutral gas density (n Ne and n Xe ). There is considerable effect of Xe contents on (n Xe /n Ne )I Ne(585nm) /I Xe(823nm) especially in initial stage of discharge. The time‐resolved measurement of (n Xe /n Ne )I Ne(585nm) /I Xe(828nm) is useful to estimate the dynamic change of electron energy in a PDP micro‐discharge.

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