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P‐93: Analysis of Optical Emission Spectra from AC‐PDPs for Various Xe Content
Author(s) -
Uchida Giichiro,
Kajiyama Hiroshi,
Shinoda Tsutae
Publication year - 2007
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1889/1.2785359
Subject(s) - xenon , atomic physics , spectral line , emission intensity , emission spectrum , intensity (physics) , analytical chemistry (journal) , atom (system on chip) , chemistry , physics , ion , optics , organic chemistry , chromatography , astronomy , computer science , embedded system
Here is presented the time‐resolved measurements on optical emission spectra from AC‐PDP with various Xe contents. Experiments show that the relative emission intensity (n Xe /n Ne) I Ne(585nm) /I Xe(823nm) , which is induced from Ne and Xe atom, drastically decreases with discharge time, where the relative emission intensity is normalized by neutral gas density (n Ne and n Xe ). There is considerable effect of Xe contents on (n Xe /n Ne )I Ne(585nm) /I Xe(823nm) especially in initial stage of discharge. The time‐resolved measurement of (n Xe /n Ne )I Ne(585nm) /I Xe(828nm) is useful to estimate the dynamic change of electron energy in a PDP micro‐discharge.