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P‐71: Investigation of Optical Films Ripple Phenomenon in TFT‐LCD Module by Numerical Computing
Author(s) -
Lin MaoHsing,
Chen YungKan,
Kuo WuCheng,
Huang KunFeng
Publication year - 2007
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1889/1.2785332
Subject(s) - ripple , thin film transistor , brightness , transistor , luminance , liquid crystal display , materials science , optoelectronics , optics , computer science , physics , electrical engineering , engineering , nanotechnology , layer (electronics) , voltage
Abstract Mura is an appearance that indicates low contrast and nonuniform brightness in thin‐film transistor liquid‐ crystal display (TFT‐LCD) devices. It is kinds of optical defects, such as ripple, smear, Newton's rings and moiré, etc. This article primarily discusses ripple of optical films by using both experimental and numerical model to help understand how ripple occurs and why ripple seen by inspectors. After performing numerical analysis, we discover the root cause that induces ripple and realize why luminance on film‐wrinkled area is varied, finally conclude the parameters that control physical phenomenon.