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P‐59: Dielectric Constants of Display Optical Components
Author(s) -
Paukshto Michael,
Lovetskiy Konstantin,
Zhukov Andrey
Publication year - 2007
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1889/1.2785320
Subject(s) - dielectric , stack (abstract data type) , polarization (electrochemistry) , materials science , reflectivity , optics , software , liquid crystal display , characterization (materials science) , optoelectronics , computer science , physics , chemistry , nanotechnology , programming language
The paper introduces novel software code for evaluation of dielectric tensor of biaxial layer incorporated into multilayer stack. The algorithm utilizes the reflectance and transmttance for several polarization states and angles of incidence in the case of Berreman approach or reflective and transmissive Mueller‐matrixes in the case of extended Jones method. We analyzed some common methods for characterization of LCD components by use of transmissive measurements.