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P‐200: Evaluation of Different OLED‐Stacks for Active‐Matrix OLED Microdisplays on CMOS‐Substrates
Author(s) -
Kreye Daniel,
Toerker Michael,
Vogel Uwe,
Amelung Joerg
Publication year - 2006
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1889/1.2433688
Subject(s) - oled , optoelectronics , active matrix , luminance , materials science , cmos , diode , voltage , doping , transistor , layer (electronics) , thin film transistor , electrical engineering , optics , nanotechnology , physics , engineering
Highly efficient, low‐voltage organic light emitting diodes (OLEDs) are well suitable for the integration into a CMOS‐process. Different OLED‐stacks with doped charge transport layers were prepared on different two metal layer CMOS test substrates without active transistor area. Afterwards, the different test displays were measured and compared with respect to their performance (current, luminance, voltage, luminance dependence on viewing angle, optical outcoupling etc.)