P‐186: Enhanced Efficiency and Stability of Organic Light‐Emitting Diodes with Copper Hexadecafluorophthalocyanine Doped Hole Transport Layer | Zendy

Shin YuCheol | Zendy; Baek HeumeIl | Zendy; Kwak JeongHoon | Zendy; Noh SeungWook | Zendy; Lee Changhee | Zendy

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P‐186: Enhanced Efficiency and Stability of Organic Light‐Emitting Diodes with Copper Hexadecafluorophthalocyanine Doped Hole Transport Layer

Author(s) -

Shin YuCheol,

Baek HeumeIl,

Kwak JeongHoon,

Noh SeungWook,

Lee Changhee

Publication year - 2006

Publication title -

sid symposium digest of technical papers

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.351

H-Index - 44

eISSN - 2168-0159

pISSN - 0097-966X

DOI - 10.1889/1.2433673

Subject(s) - oled , materials science , doping , diode , optoelectronics , electroluminescence , indium tin oxide , layer (electronics) , bilayer , copper , aluminium , thermal stability , indium , chemistry , nanotechnology , composite material , metallurgy , biochemistry , organic chemistry , membrane

We report the enhancement of the electroluminescence (EL) efficiency and the device stability of organic light‐emitting diodes (OLEDs) by inserting a copper hexadecafluorophthalocyanine (F 16 CuPC)‐doped N,N′‐di(1‐naphthyl)‐N,N′‐diphenylbenzidine (α‐NPD) layer between an indium‐tin oxide and α‐NPD. Compared with the reference device consisting of the bilayer structure of α‐NPD and tris(8‐hydroxyquinoline) aluminum (Alq 3 ), the devices having F 16 CuPC‐doped α‐NPD show not only an increased EL efficiency (∼4.5 cd/A compared with ∼3.8 cd/A for the reference device) and lower driving voltage but also a longer lifetime and smaller operating voltage variation over time. It is suggested that the improved device performance can be attributed to the higher hole‐injection efficiency and thermal stability of the F 16 CuPC‐doped α‐NPD layer.

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