Premium
P‐89: The Effect of Dehydration of MgO Protecting Layer on the XPS Spectra and the Electrical Properties in AC‐PDP
Author(s) -
Moon Sung Hwan,
Heo Tae Wook,
Park Sun Young,
Kim Hyeong Joon
Publication year - 2006
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1889/1.2433557
Subject(s) - x ray photoelectron spectroscopy , dehydration , spectral line , analytical chemistry (journal) , valence (chemistry) , materials science , surface layer , electron , chemistry , layer (electronics) , nuclear magnetic resonance , nanotechnology , biochemistry , physics , organic chemistry , chromatography , astronomy , quantum mechanics
As the e‐beam evaporated MgO thin films were exposed to the air, the shiny surface was changed to be dull and the firing voltage was also increased by about 25 volts due to the hydration of surface. To figure out the effect of hydration on the electrical property, XPS analysis was conducted. XPS spectra show that the density of state, after etching the films, was changed. Especially the valence band edge was shifted to lower binding state and the intensity of valence band was increased. Similar behavior was observed when the films were heat treated. It means that the electrons can be ejected more easily and the ejected electrons have more energy after dehydration. Consequently the electrical property could have improved after dehydration.