Premium
P‐60: OLED Failure Analysis and Pinpoint Shot Repair of Fault using an Optical Coaxial System of High Sensitive CCD and a Laser
Author(s) -
Akatsu Mitsutoshi,
Tsutsui Naganori,
Miura Nobuhito,
Miyazaki Yoshihiro
Publication year - 2006
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1889/1.2433522
Subject(s) - oled , laser , clearance , materials science , coaxial , reliability (semiconductor) , optics , optoelectronics , computer science , physics , medicine , telecommunications , nanotechnology , power (physics) , layer (electronics) , quantum mechanics , urology
A new concept of defect isolation and pinpoint laser repair to the isolated defect in OLED devices has been studied. High sensitive CCD has been combined with laser system (YAG: 532nm) on coaxial optics. An OLED has been submitted for defect isolation and laser repairing. The detected tiny size fault of some μm has been repaired by laser precision shot. As the result of this study, it is cleared that this method has effective to recover the OLED device function as I‐V characteristic and to improve OLED reliability lifetime.