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P‐36: Statistical Investigation on the Variation Behavior of Low‐Temperature Poly‐ Si TFTs for Circuit Simulation
Author(s) -
Huang ShihChe,
Peng GuoFeng,
Chern JyhLong,
Tai YaHsiang
Publication year - 2006
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1889/1.2433493
Subject(s) - variation (astronomy) , coefficient of variation , materials science , differential (mechanical device) , biological system , statistical physics , statistics , computer science , mathematics , thermodynamics , physics , astrophysics , biology
In this paper, the variation characteristics of LTPS TFTs are statistically investigated. A description is proposed to fit the variation behaviors, which the coefficient of determination is higher than 0.95, reflecting the validation of the model. Furthermore, the proposed models are used to simulate the performance of the differential pair.