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47.4: Lifetime of Thin‐Film Encapsulation and its Impact on OLED Device Performance
Author(s) -
Hemerik Marcel,
Erven Rob,
Vangheluwe Rik,
Yang James,
Rijswijk Tom,
Winters Rogier,
Rens Bas
Publication year - 2006
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1889/1.2433297
Subject(s) - encapsulation (networking) , materials science , oled , optoelectronics , polymer , thin film , nanotechnology , composite material , computer science , computer network , layer (electronics)
We present our work on the optimization of our thin film encapsulation process. Except for particle related defects, encapsulation lifetimes of over 500 hours at 60°C and 90 % rH. have been reached over a complete 20″ first direct comparison of the luminescence decay of our TFE devices and identical glass‐desiccant encapsulated devices clearly shows that lifetime of these PLED devices is no longer limited by the encapsulation method, but by the intrinsic quality of the light emitting polymers.