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46.3: A 2.2″ QVGA a‐Si TFT LCD with High Reliability Integrated Gate Driver
Author(s) -
Edo Susumu,
Wakagi Masatoshi,
Komura Shinichi
Publication year - 2006
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1889/1.2433291
Subject(s) - thin film transistor , reliability (semiconductor) , liquid crystal display , gate driver , materials science , data retention , voltage , computer science , electrical engineering , optoelectronics , engineering , nanotechnology , physics , power (physics) , layer (electronics) , quantum mechanics
A 2.2″ QVGA a‐Si TFT‐LCD with a novel integrated gate driver has been developed. High reliability is achieved by assigning pull‐down and retention processes to two individual TFTs and by stabilizing the gate voltages of the pull‐up TFTs. The developed LCD shows sufficient performance even at −35°C after a 5000hour operation test at 55°C.