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Uniformity metrology in ultra‐thin LCoS LCDs
Author(s) -
Gelder Roland,
Melnik George
Publication year - 2006
Publication title -
journal of the society for information display
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.578
H-Index - 52
eISSN - 1938-3657
pISSN - 1071-0922
DOI - 10.1889/1.2185271
Subject(s) - citation , computer science , information retrieval , library science
— The synergy between measurement methodology and process development to monitor, control, and qualify the uniformity of the ultra‐thin‐cell gap single‐panel liquid‐crystal‐on‐silicon (LCoS) device.