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Characterization of inhomogeneous retarders
Author(s) -
Becker Michael E.
Publication year - 2006
Publication title -
journal of the society for information display
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.578
H-Index - 52
eISSN - 1938-3657
pISSN - 1071-0922
DOI - 10.1889/1.2166842
Subject(s) - retarder , optics , plane (geometry) , characterization (materials science) , principal (computer security) , materials science , layer (electronics) , computer science , physics , geometry , mathematics , nanotechnology , composite material , operating system
— Various approaches for the measurement and evaluation of the optical characteristics of compound retarder sheets will be presented and their features and limitations will be discussed. Two ways of modeling the actual multilayer structure with an inclined uniaxial indicatrix and an inhomogeneous biaxial layer plus negative c‐plate is introduced and compared, and the performance of these models is analyzed for the principal plane of light incidence and for arbitrary directions of light propagation.