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5.2: New Technique of Measuring of the Jones Matrix for a Polarization Medium at Oblique Light Incidence
Author(s) -
Saitoh Yukito,
Mori Hiroyuki,
Hirakata Junichi,
Mihayashi Keiji
Publication year - 2005
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1889/1.2036486
Subject(s) - oblique case , polarization (electrochemistry) , optics , incidence matrix , physics , chemistry , quantum mechanics , philosophy , linguistics , node (physics)
We propose a new technique of measuring the Jones matrix for a polarization medium (ex. optical compensation film) based on ellipsometry experimental methodology at oblique light incidence. Unlike uniaxial, biaxial, and N‐stacked birefringent layer models, this technique describes the medium's polarization properties directly without any assumptions about the internal microscopic physical parameters. The obtained Jones matrix gives an accurate prediction of viewing angle properties of the liquid crystal displays.