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P‐58: High‐Resolution, High‐Speed Inspection of Display Glass
Author(s) -
Potts Timothy A.,
Ullrich Wolfgang
Publication year - 2005
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1889/1.2036483
Subject(s) - modular design , line (geometry) , materials science , pixel , optics , high resolution , production line , laser , display device , resolution (logic) , computer graphics (images) , computer science , artificial intelligence , engineering , physics , mechanical engineering , geology , remote sensing , geometry , mathematics , operating system
The combined trends of larger display glass sizes coupled with greater pixel density create ever more challenging production/quality issues. Internal defects as small as 10–20 microns can dramatically affect display quality. Even protrusions (bumps) as small as 0.5 microns on the A‐side can cause defective displays. The ability to detect these defects, on‐line has been impossible, until now. New, high‐resolution telecentric laser scanners have been developed to provide on‐line inspection of Gen 7 display glass for internal defects of 10 microns and protrusions of 0.5 microns, at full line speed. The system is modular and can be readily adapted to even larger displays.