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5.1: Characterization of Inhomogeneous Retarders
Author(s) -
Becker Michael E.
Publication year - 2005
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1889/1.2036475
Subject(s) - retarder , plane (geometry) , characterization (materials science) , optics , layer (electronics) , inclined plane , computer science , materials science , physics , engineering , mathematics , mechanical engineering , geometry , nanotechnology , composite material
Abstract This paper presents various approaches for measurement and evaluation of optical characteristics of compound retarder sheets and discusses their features and limitations. We introduce and compare two ways of modeling the actual multilayer structure with an inclined uniaxial indicatrix and an inhomogeneous biaxial layer plus negative c‐plate, and the performance of these models is analyzed for the principle plane of light incidence and for arbitrary directions of light propagation.